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Characterisation of defects in thin films of hydrogenated amorphous carbon

Collins, M, Barklie, RC, Anguita, JV, Carey, JD and Silva, SRP (2000) Characterisation of defects in thin films of hydrogenated amorphous carbon In: 10th European Conference on Diamond, Diamond-Like Materials, Nitrides and Silicon Carbide (Diamond 1999), 1999-09-12 - 1999-09-17, PRAGUE, CZECH REPUBLIC.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Collins, MUNSPECIFIEDUNSPECIFIED
Barklie, RCUNSPECIFIEDUNSPECIFIED
Anguita, JVUNSPECIFIEDUNSPECIFIED
Carey, JDdavid.carey@surrey.ac.ukUNSPECIFIED
Silva, SRPs.silva@surrey.ac.ukUNSPECIFIED
Date : 1 April 2000
Identification Number : 10.1016/S0925-9635(99)00325-8
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE SA, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Multidisciplinary, Materials Science, MATERIALS SCIENCE, MULTIDISCIPLINARY, defects, electron paramagnetic resonance, hydrogenated amorphous carbon, silicon substrate, ELECTRON-SPIN-RESONANCE, A-C-H
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:48
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/832767

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