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An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K

Jones, BJ, Barklie, RC, Smith, G, El Mkami, H, Carey, JD and Silva, SRP (2003) An EPR study at X- and W-band of defects in a-C : H films in the temperature range 5-300 K In: 4th Specialist Meeting on Amorphous Carbon (SMAC 2002), 2002-09-05 - 2002-09-06, UNIV BARCELONA, DEPT APPL PHYS & OPT, BARCELONA, SPAIN.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Jones, BJUNSPECIFIEDUNSPECIFIED
Barklie, RCUNSPECIFIEDUNSPECIFIED
Smith, GUNSPECIFIEDUNSPECIFIED
El Mkami, HUNSPECIFIEDUNSPECIFIED
Carey, JDdavid.carey@surrey.ac.ukUNSPECIFIED
Silva, SRPs.silva@surrey.ac.ukUNSPECIFIED
Date : 1 February 2003
Identification Number : https://doi.org/10.1016/S0925-9635(03)00012-8
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE SA, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Multidisciplinary, Materials Science, MATERIALS SCIENCE, MULTIDISCIPLINARY, defects, EPR, anisotropy, amorphous carbon, TETRAHEDRAL AMORPHOUS-CARBON, ELECTRON-PARAMAGNETIC-RESONANCE, SPIN-RESONANCE, HYDROGENATED CARBON, CENTERS, SPECTROSCOPY, IMPLANTATION, DEPENDENCE, ENERGY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:47
Last Modified : 17 May 2017 14:58
URI: http://epubs.surrey.ac.uk/id/eprint/832749

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