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THE ANALYSIS OF THE TEMPERATURE-DEPENDENCE OF PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY IN THE PRESENCE OF CARRIER TRAPPING - APPLICATION TO POLYCRYSTALLINE SILICON

LOURENCO, MA, HOMEWOOD, KP and MCLELLAN, RD (1993) THE ANALYSIS OF THE TEMPERATURE-DEPENDENCE OF PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY IN THE PRESENCE OF CARRIER TRAPPING - APPLICATION TO POLYCRYSTALLINE SILICON JOURNAL OF APPLIED PHYSICS, 73 (6). pp. 2958-2964.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
LOURENCO, MAm.lourenco@surrey.ac.ukUNSPECIFIED
HOMEWOOD, KPUNSPECIFIEDUNSPECIFIED
MCLELLAN, RDUNSPECIFIEDUNSPECIFIED
Date : 15 March 1993
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:44
Last Modified : 17 May 2017 14:58
URI: http://epubs.surrey.ac.uk/id/eprint/832521

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