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EVALUATION OF SILICON-ON-INSULATOR SUBSTRATES USING PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY

LOURENCO, MA, HOMEWOOD, KP and HEMMENT, PLF (1993) EVALUATION OF SILICON-ON-INSULATOR SUBSTRATES USING PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY JOURNAL OF APPLIED PHYSICS, 74 (11). pp. 6754-6758.

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Item Type: Article
Authors :
NameEmailORCID
LOURENCO, MAm.lourenco@surrey.ac.ukUNSPECIFIED
HOMEWOOD, KPUNSPECIFIEDUNSPECIFIED
HEMMENT, PLFUNSPECIFIEDUNSPECIFIED
Date : 1 December 1993
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, THERMAL DONORS, CZOCHRALSKI SILICON, SIMOX STRUCTURES, OXYGEN DONOR, DEFECTS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:44
Last Modified : 17 May 2017 14:58
URI: http://epubs.surrey.ac.uk/id/eprint/832519

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