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Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

Pacheco, FJ, Araujo, D, Molina, SI, Garcia, R, Sacedon, A, Gonzalez-Sanz, F, Calleja, E, Kidd, P and Lourenco, MA (1998) Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs MATERIALS SCIENCE AND TECHNOLOGY, 14 (12). pp. 1273-1278.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Pacheco, FJUNSPECIFIEDUNSPECIFIED
Araujo, DUNSPECIFIEDUNSPECIFIED
Molina, SIUNSPECIFIEDUNSPECIFIED
Garcia, RUNSPECIFIEDUNSPECIFIED
Sacedon, AUNSPECIFIEDUNSPECIFIED
Gonzalez-Sanz, FUNSPECIFIEDUNSPECIFIED
Calleja, EUNSPECIFIEDUNSPECIFIED
Kidd, PUNSPECIFIEDUNSPECIFIED
Lourenco, MAm.lourenco@surrey.ac.ukUNSPECIFIED
Date : 1 December 1998
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Multidisciplinary, Metallurgy & Metallurgical Engineering, Materials Science, MATERIALS SCIENCE, MULTIDISCIPLINARY, METALLURGY & METALLURGICAL ENGINEERING, ANOMALOUS STRAIN RELAXATION, PLASTIC RELAXATION, EPITAXIAL LAYERS, THIN-FILMS, GROWTH, SUPERLATTICES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:44
Last Modified : 17 May 2017 14:58
URI: http://epubs.surrey.ac.uk/id/eprint/832512

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