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TEM studies of dislocation-based silicon light emitting devices

Milosavljevic, M, Lourenco, MA, Siddiqui, MSA, Shao, G, Gwilliam, RM and Homewood, KP (2004) TEM studies of dislocation-based silicon light emitting devices In: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), 2003-09-03 - 2003-09-05, Univ Oxford, Examinat Sch, Oxford, ENGLAND.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Milosavljevic, MUNSPECIFIEDUNSPECIFIED
Lourenco, MAm.lourenco@surrey.ac.ukUNSPECIFIED
Siddiqui, MSAUNSPECIFIEDUNSPECIFIED
Shao, GUNSPECIFIEDUNSPECIFIED
Gwilliam, RMUNSPECIFIEDUNSPECIFIED
Homewood, KPUNSPECIFIEDUNSPECIFIED
Date : 1 January 2004
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDMcVitie, SUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMcComb, DUNSPECIFIEDUNSPECIFIED
publisherIOP PUBLISHING LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Characterization & Testing, Microscopy, Physics, Multidisciplinary, Materials Science, Physics
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:44
Last Modified : 17 May 2017 14:58
URI: http://epubs.surrey.ac.uk/id/eprint/832485

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