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Atom probe tomography

Miller, MK and Forbes, RG (2009) Atom probe tomography MATERIALS CHARACTERIZATION, 60 (6). pp. 461-469.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Miller, MKUNSPECIFIEDUNSPECIFIED
Forbes, RGr.forbes@surrey.ac.ukUNSPECIFIED
Date : 1 June 2009
Identification Number : https://doi.org/10.1016/j.matchar.2009.02.007
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Multidisciplinary, Metallurgy & Metallurgical Engineering, Materials Science, Characterization & Testing, Materials Science, MATERIALS SCIENCE, CHARACTERIZATION & TESTING, Atom probe tomography, Field evaporation, Field ion microcopy, FIELD-EVAPORATION, INTERFACIAL EXCESS, RECONSTRUCTION, MICROSCOPY, DEPENDENCE, MECHANISMS, SOLUTE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:35
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831941

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