Atom probe tomography
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Miller, MK and Forbes, RG (2009) Atom probe tomography MATERIALS CHARACTERIZATION, 60 (6). pp. 461-469.
Full text not available from this repository.| Item Type: | Article | |||||||||
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| Date : | 1 June 2009 | |||||||||
| DOI : | 10.1016/j.matchar.2009.02.007 | |||||||||
| Uncontrolled Keywords : | Science & Technology, Technology, Materials Science, Multidisciplinary, Metallurgy & Metallurgical Engineering, Materials Science, Characterization & Testing, Materials Science, MATERIALS SCIENCE, CHARACTERIZATION & TESTING, Atom probe tomography, Field evaporation, Field ion microcopy, FIELD-EVAPORATION, INTERFACIAL EXCESS, RECONSTRUCTION, MICROSCOPY, DEPENDENCE, MECHANISMS, SOLUTE | |||||||||
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| Depositing User : | Symplectic Elements | |||||||||
| Date Deposited : | 17 May 2017 11:35 | |||||||||
| Last Modified : | 16 Jan 2019 18:18 | |||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/831941 |
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