Atom probe tomography

Miller, MK and Forbes, RG (2009) Atom probe tomography MATERIALS CHARACTERIZATION, 60 (6). pp. 461-469.

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Item Type:	Article
Authors :	Name Email ORCID Miller, MK UNSPECIFIED UNSPECIFIED Forbes, RG r.forbes@surrey.ac.uk UNSPECIFIED
Date :	1 June 2009
Identification Number :	https://doi.org/10.1016/j.matchar.2009.02.007
Uncontrolled Keywords :	Science & Technology, Technology, Materials Science, Multidisciplinary, Metallurgy & Metallurgical Engineering, Materials Science, Characterization & Testing, Materials Science, MATERIALS SCIENCE, CHARACTERIZATION & TESTING, Atom probe tomography, Field evaporation, Field ion microcopy, FIELD-EVAPORATION, INTERFACIAL EXCESS, RECONSTRUCTION, MICROSCOPY, DEPENDENCE, MECHANISMS, SOLUTE
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	17 May 2017 11:35
Last Modified :	17 May 2017 14:57
URI:	http://epubs.surrey.ac.uk/id/eprint/831941

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