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Fabric defect detection by Fourier analysis

Chan, C-H and Pang, GKH Fabric defect detection by Fourier analysis Industry Applications, IEEE Transactions on, 836, 5. 1267 -1276 - 1267 -1276.

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Item Type: Article
Authors :
Pang, GKH
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:34
Last Modified : 19 Jun 2018 06:10

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