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Fabric defect detection by Fourier analysis

Chan, C-H and Pang, GKH Fabric defect detection by Fourier analysis Industry Applications, IEEE Transactions on, 836, 5. 1267 -1276 - 1267 -1276.

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Item Type: Article
Authors :
NameEmailORCID
Chan, C-Hchiho.chan@surrey.ac.ukUNSPECIFIED
Pang, GKHUNSPECIFIEDUNSPECIFIED
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:34
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831937

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