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High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

Ruddy, FH, Seidel, JG and Sellin, P (2009) High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector In: Nuclear Science Symposium, 2009-10-24 - 2009-11-01, Orlando, USA.

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Abstract

The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated. 238Pu alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 A�¿ titanium Schottky contact (entrance window). The observed FWHM for the 238Pu 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Ruddy, FHUNSPECIFIEDUNSPECIFIED
Seidel, JGUNSPECIFIEDUNSPECIFIED
Sellin, Pp.sellin@surrey.ac.ukUNSPECIFIED
Date : 2009
Identification Number : https://doi.org/10.1109/NSSMIC.2009.5402072
Contributors :
ContributionNameEmailORCID
publisherIEEE, UNSPECIFIEDUNSPECIFIED
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:34
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831913

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