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Cathodoluminescence studies of InGaN/GaN layers in the scanning electron microscope

Bewick, A, Henley, SJ and Cherns, D (1999) Cathodoluminescence studies of InGaN/GaN layers in the scanning electron microscope In: Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99), 1999-08-24 - 1999-08-27, UNIV SHEFFIELD, SHEFFIELD, ENGLAND.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Bewick, AUNSPECIFIEDUNSPECIFIED
Henley, SJs.henley@surrey.ac.ukUNSPECIFIED
Cherns, DUNSPECIFIEDUNSPECIFIED
Date : 1 January 1999
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDKiely, CJUNSPECIFIEDUNSPECIFIED
publisherIOP PUBLISHING LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Crystallography, Metallurgy & Metallurgical Engineering, Microscopy, Physics, Applied, Physics, Multidisciplinary, Physics, Condensed Matter, Physics
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:33
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831817

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