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SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER

MURTAGH, M, CREAN, GM, FLAHERTY, T and JEYNES, C (1992) SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER In: SYMP OF THE 1991 SPRING CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : LASER SURFACE PROCESSING AND CHARACTERIZATION, 1991-05-28 - 1991-05-31, STRASBOURG, FRANCE.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
MURTAGH, MUNSPECIFIEDUNSPECIFIED
CREAN, GMUNSPECIFIEDUNSPECIFIED
FLAHERTY, TUNSPECIFIEDUNSPECIFIED
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 January 1992
Identification Number : https://doi.org/10.1016/0169-4332(92)90094-E
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Chemistry, Materials Science, Physics, CHEMISTRY, PHYSICAL, MATERIALS SCIENCE, COATINGS & FILMS, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:32
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831748

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