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SIMS, RBS, and ion channelling studies of H-2(+) or O-18(+) irradiated LaAlO3, (100) single crystal

Li, YP, Kilner, JA, Tate, TJ, Chater, RJ, Jeynes, C and Jafri, ZH (1996) SIMS, RBS, and ion channelling studies of H-2(+) or O-18(+) irradiated LaAlO3, (100) single crystal In: 12th International Conference on Ion Beam Analysis (IBA-12), 1995-05-22 - 1995-05-26, ARIZONA STATE UNIV CAMPUS, TEMPE, AZ.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Li, YPUNSPECIFIEDUNSPECIFIED
Kilner, JAUNSPECIFIEDUNSPECIFIED
Tate, TJUNSPECIFIEDUNSPECIFIED
Chater, RJUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Jafri, ZHUNSPECIFIEDUNSPECIFIED
Date : 1 September 1996
Identification Number : https://doi.org/10.1016/0168-583X(95)01201-X
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, YBA2CU3O7-X THIN-FILMS, LASER EVAPORATION, MICROSTRUCTURE, RELEASE, SAMPLES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:32
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831724

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