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Accurate RBS measurements of the indium content of InGaAs thin films

Jeynes, C, Jafri, ZH, Webb, RP, Kimber, AC and Ashwin, MJ (1997) Accurate RBS measurements of the indium content of InGaAs thin films SURFACE AND INTERFACE ANALYSIS, 25 (4). pp. 254-260.

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Item Type: Article
Authors :
NameEmailORCID
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Jafri, ZHUNSPECIFIEDUNSPECIFIED
Webb, RPr.webb@surrey.ac.ukUNSPECIFIED
Kimber, ACUNSPECIFIEDUNSPECIFIED
Ashwin, MJUNSPECIFIEDUNSPECIFIED
Date : 1 April 1997
Identification Number : https://doi.org/10.1002/(SICI)1096-9918(199704)25:4<254::AID-SIA232>3.0.CO;2-F
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, InGaAs, RBS, absolute composition determination, measurement accuracy
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831719

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