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The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

DeSouza, RA, Kilner, JA and Jeynes, C (1997) The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC) In: VIII International Conference on Solid State Protonic Conductors, 1996-08-18 - 1996-08-23, GOL, NORWAY.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
DeSouza, RAUNSPECIFIEDUNSPECIFIED
Kilner, JAUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 May 1997
Identification Number : https://doi.org/10.1016/S0167-2738(97)00038-6
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Physics, Condensed Matter, Chemistry, Physics, CHEMISTRY, PHYSICAL, PHYSICS, CONDENSED MATTER, Perovskite oxides, SIMS, IEDP, oxygen diffusion, fluorine, BARIUM CERATE, CONDUCTIVITY, OXIDES, BACEO3
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831718

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