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Photoluminescence and backscattering characterization of 6H SiC implanted with erbium and oxygen ions

Kozanecki, A, Jeynes, C, Sealy, BJ, Jantsch, W, Lanzerstorfer, S, Heiss, W and Prechtl, G (1998) Photoluminescence and backscattering characterization of 6H SiC implanted with erbium and oxygen ions In: 7th International Conference on Silicon Carbide, III-Nitrides and Related Materials (ICSCIII-N 97), 1997-08-31 - 1997-09-05, STOCKHOLM, SWEDEN.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Kozanecki, AUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Sealy, BJUNSPECIFIEDUNSPECIFIED
Jantsch, WUNSPECIFIEDUNSPECIFIED
Lanzerstorfer, SUNSPECIFIEDUNSPECIFIED
Heiss, WUNSPECIFIEDUNSPECIFIED
Prechtl, GUNSPECIFIEDUNSPECIFIED
Date : 1 January 1998
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDPensl, GUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMorkoc, HUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMonemar, BUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDJanzen, EUNSPECIFIEDUNSPECIFIED
publisherTRANSTEC PUBLICATIONS LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Materials Science, erbium centres, ion implantation, photoluminescence, RBS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831710

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