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High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices

Barradas, NP, Jeynes, C, Mironov, OA, Phillips, PJ and Parker, EHC (1998) High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 139 (1-4). pp. 239-243.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Barradas, NPUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Mironov, OAUNSPECIFIEDUNSPECIFIED
Phillips, PJUNSPECIFIEDUNSPECIFIED
Parker, EHCUNSPECIFIEDUNSPECIFIED
Date : 1 April 1998
Identification Number : https://doi.org/10.1016/S0168-583X(97)00965-8
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, high depth resolution, RBS, Si-SiGe, multilayers
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831703

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