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Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si

Bibic, N, Milosavljevic, M, Perusko, D and Jeynes, C (1998) Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si In: 5th European Vacuum Conference (EVC 5) / 10th International Conference on Thin Films (ICTF 10), 1996-09-23 - 1996-09-27, UNIV SALAMANCA, SALAMANCA, SPAIN.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Bibic, NUNSPECIFIEDUNSPECIFIED
Milosavljevic, MUNSPECIFIEDUNSPECIFIED
Perusko, DUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 April 1998
Identification Number : 10.1016/S0040-6090(97)00528-2
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE SA, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, ion beam, Ta/Pd bilayers, vacuum, THIN-FILMS, SILICON
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831701

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