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Characterization of as implanted silicides by frequency noise level measurements

Stojanovic, M, Milosavljevic, M and Jeynes, C (1998) Characterization of as implanted silicides by frequency noise level measurements In: 2nd Yugoslav Conference on Advanced Materials (YUGOMAT II), 1997-09-15 - 1997-09-19, HERCEG-NOVI, YUGOSLAVIA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Stojanovic, MUNSPECIFIEDUNSPECIFIED
Milosavljevic, MUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 January 1998
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDUskokovic, DPUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMilonjic, SKUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDRakovic, DIUNSPECIFIEDUNSPECIFIED
publisherTRANSTEC PUBLICATIONS LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Ceramics, Materials Science, Multidisciplinary, Metallurgy & Metallurgical Engineering, Materials Science, Coatings & Films, Materials Science, Composites, Polymer Science, Materials Science, ion beam, implantation, surface, silicide, RBS, noise level characterization, CONTACTS, SILICON
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831700

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