University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES

Simonsen, AC, Pohler, JP, Jeynes, C and Tougaard, S (1999) Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES SURFACE AND INTERFACE ANALYSIS, 27 (1). pp. 52-56.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Simonsen, ACUNSPECIFIEDUNSPECIFIED
Pohler, JPUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Tougaard, SUNSPECIFIEDUNSPECIFIED
Date : 1 January 1999
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, quantitative XPS, RBS, thin films, inelastic peak shape analysis, RAY PHOTOELECTRON-SPECTROSCOPY, QUANTITATIVE-ANALYSIS, NANOSTRUCTURE, GROWTH, FILMS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831696

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800