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Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing

Barradas, NP, Jeynes, C, Webb, RP, Kreissig, U and Grotzschel, R (1999) Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 149 (1-2). pp. 233-237.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Barradas, NPUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Webb, RPr.webb@surrey.ac.ukUNSPECIFIED
Kreissig, UUNSPECIFIEDUNSPECIFIED
Grotzschel, RUNSPECIFIEDUNSPECIFIED
Date : 1 January 1999
Identification Number : 10.1016/S0168-583X(98)00731-9
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, Rutherford backscattering, elastic recoil detection analysis, Simulated Annealing, RUTHERFORD
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831695

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