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High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms

Barradas, NP, Knights, AP, Jeynes, C, Mironov, OA, Grasby, TJ and Parker, EHC (1999) High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms PHYSICAL REVIEW B, 59 (7). pp. 5097-5105.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Barradas, NPUNSPECIFIEDUNSPECIFIED
Knights, APUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Mironov, OAUNSPECIFIEDUNSPECIFIED
Grasby, TJUNSPECIFIEDUNSPECIFIED
Parker, EHCUNSPECIFIEDUNSPECIFIED
Date : 15 February 1999
Identification Number : https://doi.org/10.1103/PhysRevB.59.5097
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Condensed Matter, Physics, PHYSICS, CONDENSED MATTER, IBA METHODS, RBS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831690

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