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Rapid accurate automated analysis of complex ion beam analysis data

Marriott, PK, Jenkin, M, Jeynes, C, Barradas, NP, Webb, RP and Sealy, BJ (1999) Rapid accurate automated analysis of complex ion beam analysis data In: 15th International Conference on the Application of Accelerators in Research and Industry, 1998-11-04 - 1998-11-07, UNIV N TEXAS, DENTON, TX.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Marriott, PK
Jenkin, M
Jeynes, Cc.jeynes@surrey.ac.uk
Barradas, NP
Webb, RPr.webb@surrey.ac.uk
Sealy, BJ
Date : 1 January 1999
Contributors :
ContributionNameEmailORCID
Duggan, JL
Morgan, IL
publisherAMER INST PHYSICS,
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Characterization & Testing, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, Particles & Fields, Spectroscopy, Chemistry, Materials Science, Physics, ANNEALING ANALYSIS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831680

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