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Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data

Jeynes, C, Barradas, NP, Wilde, JR and Greer, AL (2000) Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 161. pp. 287-292.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Barradas, NPUNSPECIFIEDUNSPECIFIED
Wilde, JRUNSPECIFIEDUNSPECIFIED
Greer, ALUNSPECIFIEDUNSPECIFIED
Date : 1 March 2000
Identification Number : https://doi.org/10.1016/S0168-583X(99)00950-7
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, RES, non-Rutherford, data analysis, simulated annealing, CROSS-SECTION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831677

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