University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Accurate depth profiling of complex optical coatings

Jeynes, C, Barradas, NP, Rafla-Yuan, H, Hichwa, BP and Close, R (2000) Accurate depth profiling of complex optical coatings SURFACE AND INTERFACE ANALYSIS, 30 (1). pp. 237-242.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Barradas, NPUNSPECIFIEDUNSPECIFIED
Rafla-Yuan, HUNSPECIFIEDUNSPECIFIED
Hichwa, BPUNSPECIFIEDUNSPECIFIED
Close, RUNSPECIFIEDUNSPECIFIED
Date : 1 August 2000
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, RES, simulated annealing, optical coatings, thin-film structure, RUTHERFORD BACKSCATTERING DATA, IBA METHODS, RESOLUTION, RBS, SIMULATION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831675

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800