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Accurate depth profiling of complex optical coatings

Jeynes, C, Barradas, NP, Rafla-Yuan, H, Hichwa, BP and Close, R (2000) Accurate depth profiling of complex optical coatings SURFACE AND INTERFACE ANALYSIS, 30 (1). pp. 237-242.

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Item Type: Article
Divisions : Surrey research (other units)
Authors :
Barradas, NP
Rafla-Yuan, H
Hichwa, BP
Close, R
Date : 1 August 2000
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, RES, simulated annealing, optical coatings, thin-film structure, RUTHERFORD BACKSCATTERING DATA, IBA METHODS, RESOLUTION, RBS, SIMULATION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 24 Jan 2020 20:56

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