Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films
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Peng, NH, Jeynes, C, Webb, RP, Chakarov, IR and Blamire, MG (2001) Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films In: E-MRS Spring Meeting on Materials Science with Ion Beams, 2000-05-30 - 2000-06-02, STRASBOURG, FRANCE.
Full text not available from this repository.Item Type: | Conference or Workshop Item (UNSPECIFIED) | ||||||||||||||||||
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Date : | 1 May 2001 | ||||||||||||||||||
DOI : | 10.1016/S0168-583X(00)00471-7 | ||||||||||||||||||
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Uncontrolled Keywords : | Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, Monte Carlo simulation, irradiation damage accumulation, YBa2Cu3O7-delta, Josephson junctions, IMPLANTATION | ||||||||||||||||||
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Depositing User : | Symplectic Elements | ||||||||||||||||||
Date Deposited : | 17 May 2017 11:31 | ||||||||||||||||||
Last Modified : | 16 Jan 2019 18:17 | ||||||||||||||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/831670 |
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