Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films

Peng, NH, Jeynes, C, Webb, RP, Chakarov, IR and Blamire, MG (2001) Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films In: E-MRS Spring Meeting on Materials Science with Ion Beams, 2000-05-30 - 2000-06-02, STRASBOURG, FRANCE.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Authors :	Name Email ORCID Peng, NH Jeynes, C c.jeynes@surrey.ac.uk Webb, RP r.webb@surrey.ac.uk Chakarov, IR Blamire, MG
Date :	1 May 2001
DOI :	10.1016/S0168-583X(00)00471-7
Contributors :	Contribution Name Email ORCID publisher ELSEVIER SCIENCE BV,
Uncontrolled Keywords :	Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, Monte Carlo simulation, irradiation damage accumulation, YBa2Cu3O7-delta, Josephson junctions, IMPLANTATION
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	17 May 2017 11:31
Last Modified :	16 Jan 2019 18:17
URI:	http://epubs.surrey.ac.uk/id/eprint/831670

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