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Optimisation of masked ion irradiation damage profiles in YBCO thin films by Monte Carlo simulation

Peng, NH, Jeynes, C, Webb, R, Chakarov, I and Blamire, M (2002) Optimisation of masked ion irradiation damage profiles in YBCO thin films by Monte Carlo simulation In: 5th European Conference on Applied Superconductivity (EUCAS 2001), 2001-08-26 - 2001-08-30, TECH UNIV DENMARK, LYNGBY, DENMARK.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Peng, NHUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Webb, Rr.webb@surrey.ac.ukUNSPECIFIED
Chakarov, IUNSPECIFIEDUNSPECIFIED
Blamire, MUNSPECIFIEDUNSPECIFIED
Date : 1 August 2002
Identification Number : 10.1016/S0921-4534(02)00740-2
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, Monte Carlo simulation, masked irradiation damage, Josephson junction, JOSEPHSON-JUNCTIONS, YBA2CU3O7-DELTA, IMPLANTATION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831658

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