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Ion beam indneed charge microscopy imaging of CVD diamond

Simon, A, Sellin, P, Lohstroh, A and Jeynes, C (2003) Ion beam indneed charge microscopy imaging of CVD diamond In: Conference on Microscopy of Semiconducting Materials, 2003-03-31 - ?, Univ Cambridge, Cambridge, ENGLAND.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Simon, AUNSPECIFIEDUNSPECIFIED
Sellin, Pp.sellin@surrey.ac.ukUNSPECIFIED
Lohstroh, Aa.lohstroh@surrey.ac.ukUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 January 2003
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDCullis, AGUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMidgley, PAUNSPECIFIEDUNSPECIFIED
publisherIOP PUBLISHING LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Characterization & Testing, Microscopy, Physics, Multidisciplinary, Physics, Condensed Matter, Materials Science, Physics, TRANSPORT
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:30
Last Modified : 17 May 2017 14:57
URI: http://epubs.surrey.ac.uk/id/eprint/831646

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