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An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films

Mollart, TP, Gibson, PN and Baker, MA (1997) An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films JOURNAL OF PHYSICS D-APPLIED PHYSICS, 30 (13). pp. 1827-1832.

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Item Type: Article
Authors :
NameEmailORCID
Mollart, TPUNSPECIFIEDUNSPECIFIED
Gibson, PNUNSPECIFIEDUNSPECIFIED
Baker, MAm.baker@surrey.ac.ukUNSPECIFIED
Date : 7 July 1997
Identification Number : https://doi.org/10.1088/0022-3727/30/13/001
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, HARD COATINGS, TITANIUM, BEHAVIOR, SPECTRA, SIZE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:29
Last Modified : 17 May 2017 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/831529

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