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A study of the chemical bonding and microstructure of ion beam-deposited CNx films including an XPS C 1s peak simulation

Baker, MA and Hammer, P (1997) A study of the chemical bonding and microstructure of ion beam-deposited CNx films including an XPS C 1s peak simulation SURFACE AND INTERFACE ANALYSIS, 25 (9). pp. 629-642.

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Item Type: Article
Authors :
NameEmailORCID
Baker, MAm.baker@surrey.ac.ukUNSPECIFIED
Hammer, PUNSPECIFIEDUNSPECIFIED
Date : 1 August 1997
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, XPS, FTIR, carbon nitride, thin film, simulation, NITRIDE THIN-FILMS, AMORPHOUS-CARBON, SPECTROSCOPY, GRAPHITE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:29
Last Modified : 17 May 2017 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/831528

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