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Near-edge X-ray absorption fine structure study of carbon nitride films

Lenardi, C, Baker, MA, Briois, V, Lecis, GC, Piseri, P and Gissler, W (2000) Near-edge X-ray absorption fine structure study of carbon nitride films In: 1999 E-MRS Conference, Symposium B: Protective Coatings and Thin Films, 1999-06-01 - 1999-06-04, STRASBOURG, FRANCE.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Lenardi, CUNSPECIFIEDUNSPECIFIED
Baker, MAm.baker@surrey.ac.ukUNSPECIFIED
Briois, VUNSPECIFIEDUNSPECIFIED
Lecis, GCUNSPECIFIEDUNSPECIFIED
Piseri, PUNSPECIFIEDUNSPECIFIED
Gissler, WUNSPECIFIEDUNSPECIFIED
Date : 1 March 2000
Identification Number : https://doi.org/10.1016/S0257-8972(99)00585-X
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE SA, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Coatings & Films, Physics, Applied, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, PHYSICS, APPLIED, carbon nitride, dual ion beam deposition, near-edge X-ray absorption fine structure, LOW-TEMPERATURE, DIAMOND, ENERGY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:29
Last Modified : 17 May 2017 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/831517

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