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Electronic relaxation in indium oxide films studied with perturbed angular correlations

Lohstroh, A, Uhrmacher, M, Wilbrandt, PJ, Wulff, H, Ziegeler, L and Lieb, KP (2004) Electronic relaxation in indium oxide films studied with perturbed angular correlations In: Joint Meeting of the 13th International Conference on Hyperfine Interactions/17th International Symposium on Nuclear Quadrupole Interactions (HFI/NQI 2004), 2004-08-22 - 2004-08-27, Bonn, GERMANY.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Lohstroh, Aa.lohstroh@surrey.ac.ukUNSPECIFIED
Uhrmacher, MUNSPECIFIEDUNSPECIFIED
Wilbrandt, PJUNSPECIFIEDUNSPECIFIED
Wulff, HUNSPECIFIEDUNSPECIFIED
Ziegeler, LUNSPECIFIEDUNSPECIFIED
Lieb, KPUNSPECIFIEDUNSPECIFIED
Date : 1 January 2004
Identification Number : https://doi.org/10.1007/s10751-005-9078-3
Contributors :
ContributionNameEmailORCID
publisherSPRINGER, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Atomic, Molecular & Chemical, Physics, Condensed Matter, Physics, Nuclear, Physics, decay after effects, electronic relaxation, indium oxide, perturbed angular correlations, (PAC), RBS, SIMS, XRD, SN-DOPED IN2O3, ELECTRICAL-PROPERTIES, BIXBYITE OXIDES, FIELD GRADIENTS, CD-111, REFINEMENT, LAYERS, MODEL, PURE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:26
Last Modified : 17 May 2017 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/831369

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