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Characteristics of focused ion beam nanoscale Josephson devices

Hao, L, Cox, DC and Gallop, JC (2009) Characteristics of focused ion beam nanoscale Josephson devices SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 22 (6), ARTN 06401.

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Item Type: Article
Authors :
NameEmailORCID
Hao, LUNSPECIFIEDUNSPECIFIED
Cox, DCd.cox@surrey.ac.ukUNSPECIFIED
Gallop, JCUNSPECIFIEDUNSPECIFIED
Date : 1 June 2009
Identification Number : https://doi.org/10.1088/0953-2048/22/6/064011
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, Condensed Matter, Physics, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, QUANTUM INTERFERENCE DEVICE, WEAK LINKS, SQUIDS, SUPERCONDUCTORS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:25
Last Modified : 17 May 2017 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/831317

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