University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Thick film compound semiconductors for X-ray imaging applications

Sellin, PJ (2006) Thick film compound semiconductors for X-ray imaging applications In: 7th International Workshop on Radiation Imaging Detectors, 2005-07-04 - 2005-07-07, Grenoble, FRANCE.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Sellin, PJp.sellin@surrey.ac.ukUNSPECIFIED
Date : 1 July 2006
Identification Number : https://doi.org/10.1016/j.nima.2006.01.110
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Particles & Fields, Spectroscopy, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, PARTICLES & FIELDS, SPECTROSCOPY, IODIDE POLYCRYSTALLINE FILMS, RADIATION DETECTORS, ENERGY RESOLUTION, PANEL DETECTORS, LARGE-AREA, HGI2, DEPOSITION, GROWTH, RADIOGRAPHY, TEMPERATURE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:20
Last Modified : 17 May 2017 14:55
URI: http://epubs.surrey.ac.uk/id/eprint/830981

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800