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A review of ion beam induced charge microscopy

Breese, MBH, Vittone, E, Vizkelethy, G and Sellin, PJ (2007) A review of ion beam induced charge microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 264 (2). pp. 345-360.

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Item Type: Article
Authors :
NameEmailORCID
Breese, MBHUNSPECIFIEDUNSPECIFIED
Vittone, EUNSPECIFIEDUNSPECIFIED
Vizkelethy, GUNSPECIFIEDUNSPECIFIED
Sellin, PJp.sellin@surrey.ac.ukUNSPECIFIED
Date : 1 November 2007
Identification Number : https://doi.org/10.1016/j.nimb.2007.09.031
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, IBIC microscopy, nuclear microprobes, charge transport measurements, SINGLE-EVENT UPSETS, HETEROJUNCTION BIPOLAR-TRANSISTORS, POLYCRYSTALLINE CVD DIAMOND, NUCLEAR MICROPROBE ANALYSIS, 4H-SIC SCHOTTKY DIODES, LATERAL IBIC TECHNIQUE, MULTIPLE-BIT UPSET, HEAVY-ION, RADIATION DETECTORS, SEMICONDUCTOR-DEVICES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:20
Last Modified : 17 May 2017 14:55
URI: http://epubs.surrey.ac.uk/id/eprint/830980

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