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Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects

Grime, GW (2009) Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects In: 42nd Zakopane School of Physics International Symposium Breaking Frontiers, 2008-05-19 - 2008-05-25, Zakopane, POLAND.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Grime, GWg.grime@surrey.ac.ukUNSPECIFIED
Date : 1 February 2009
Contributors :
ContributionNameEmailORCID
publisherPOLISH ACAD SCIENCES INST PHYSICS, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Multidisciplinary, Physics, PHYSICS, MULTIDISCIPLINARY, NUCLEAR MICROPROBE, SINGLE, NANOBEAM, FACILITY, LITHOGRAPHY, IRRADIATION, FABRICATION, SIMULATION, NANOPROBE, MICROBEAM
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:18
Last Modified : 17 May 2017 14:55
URI: http://epubs.surrey.ac.uk/id/eprint/830837

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