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New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications

Belykh, SF, Palitsin, VV, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, MG and Adams, F (2007) New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications REVIEW OF SCIENTIFIC INSTRUMENTS, 78 (8), ARTN 08510.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Belykh, SFUNSPECIFIEDUNSPECIFIED
Palitsin, VVv.palitsin@surrey.ac.ukUNSPECIFIED
Veryovkin, IVUNSPECIFIEDUNSPECIFIED
Kovarsky, APUNSPECIFIEDUNSPECIFIED
Chang, RJHUNSPECIFIEDUNSPECIFIED
Adriaens, AUNSPECIFIEDUNSPECIFIED
Dowsett, MGUNSPECIFIEDUNSPECIFIED
Adams, FUNSPECIFIEDUNSPECIFIED
Date : August 2007
Identification Number : 10.1063/1.2761021
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:15
Last Modified : 17 May 2017 14:55
URI: http://epubs.surrey.ac.uk/id/eprint/830621

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