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2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS

WHITMORE, GA, YOUNG, KDS and KIMBER, AC (1994) 2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS APPLIED STATISTICS-JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C, 43 (2). pp. 295-307.

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Item Type: Article
Authors :
NameEmailORCID
WHITMORE, GAUNSPECIFIEDUNSPECIFIED
YOUNG, KDSk.young@surrey.ac.ukUNSPECIFIED
KIMBER, ACUNSPECIFIEDUNSPECIFIED
Date : 1 January 1994
Identification Number : https://doi.org/10.2307/2986021
Uncontrolled Keywords : Science & Technology, Physical Sciences, Statistics & Probability, Mathematics, STATISTICS & PROBABILITY, BAYESIAN ANALYSIS, DEMONSTRATION TESTS, ENGINEERING DESIGN, FAILURE, GAMMA-DISTRIBUTION, INFERENCE, POISSON DISTRIBUTION, RELIABILITY, SIEGEL DISTRIBUTION, TECHNOLOGY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:11
Last Modified : 17 May 2017 14:54
URI: http://epubs.surrey.ac.uk/id/eprint/830393

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