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Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures

Hosea, TJC, Cripps, SA, Sale, TE and Hild, K (2006) Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures In: Symposium P of the Spring Meeting of the European-Materials-Research-Society entitled Curent Trends in Optical and X-ray Meterology of Advanced Materials for Nanoscale Devices, 2005-05-31 - 2005-06-03, Strasbourg, FRANCE.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Hosea, TJCUNSPECIFIEDUNSPECIFIED
Cripps, SAUNSPECIFIEDUNSPECIFIED
Sale, TEUNSPECIFIEDUNSPECIFIED
Hild, Kk.hild@surrey.ac.ukUNSPECIFIED
Date : 31 October 2006
Identification Number : 10.1016/j.apsusc.2006.05.124
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Chemistry, Materials Science, Physics, CHEMISTRY, PHYSICAL, MATERIALS SCIENCE, COATINGS & FILMS, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, optoelectronics, characterisation, optical spectroscopy (modulation spectroscopy and reflectivity), quantum wells, microcavities, FRANZ-KELDYSH OSCILLATIONS, CRITICAL-POINT PARAMETERS, PHOTOMODULATED REFLECTANCE, PHOTOREFLECTANCE SPECTRA, QUANTUM-WELLS, TEMPERATURE, GAAS, ELECTROREFLECTANCE, SEMICONDUCTORS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:06
Last Modified : 17 May 2017 14:54
URI: http://epubs.surrey.ac.uk/id/eprint/830013

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