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Caesium sputter ion source compatible with commercial SIMS instruments

Belykh, SF, Palitsin, V, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, M and Adams, F (2006) Caesium sputter ion source compatible with commercial SIMS instruments In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), 2005-09-12 - 2005-09-16, Univ Manchester, Manchester, ENGLAND.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions : Surrey research (other units)
Authors :
Belykh, SF
Veryovkin, IV
Kovarsky, AP
Chang, RJH
Adriaens, A
Dowsett, M
Adams, F
Date : 30 July 2006
DOI : 10.1016/j.apsusc.2006.02.172
Contributors :
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Chemistry, Materials Science, Physics, CHEMISTRY, PHYSICAL, MATERIALS SCIENCE, COATINGS & FILMS, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, caesium sputter ion source, non-additive sputtering, atomic and cluster ion bombardment, depth profiling, floating low energy ion gun, cluster-solid interaction, CLUSTER IONS, BOMBARDMENT, BEAMS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:06
Last Modified : 23 Jan 2020 16:28

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