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Improving fault prediction using Bayesian networks for the development of embedded software applications

Perez-Minana, E and Gras, J-J (2006) Improving fault prediction using Bayesian networks for the development of embedded software applications In: 3rd United Kingdom Workshop on Software Testing Research, 2005-09-05 - 2005-09-06, Univ Sheffield, Sheffield, ENGLAND.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Perez-Minana, Ee.perez-minana@surrey.ac.ukUNSPECIFIED
Gras, J-JUNSPECIFIEDUNSPECIFIED
Date : 1 September 2006
Identification Number : https://doi.org/10.1002/stvr.353
Contributors :
ContributionNameEmailORCID
publisherJOHN WILEY & SONS LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Computer Science, Software Engineering, Computer Science, COMPUTER SCIENCE, SOFTWARE ENGINEERING, Bayesian networks, software quality, fault prediction
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:06
Last Modified : 17 May 2017 11:06
URI: http://epubs.surrey.ac.uk/id/eprint/829992

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