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Ultra-low energy SIMS study of ultra-shallow boron implants in HPHT diamond

de la Mata, BG, Dowsett, MG and Palitsin, V (2005) Ultra-low energy SIMS study of ultra-shallow boron implants in HPHT diamond In: 10th International Workshop on Surface and Bulk Defects in CVD Diamond Films, 2005-02-23 - 2005-02-25, Diepenbee-Hasselt, BELGIUM.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
de la Mata, BGUNSPECIFIEDUNSPECIFIED
Dowsett, MGUNSPECIFIEDUNSPECIFIED
Palitsin, Vv.palitsin@surrey.ac.ukUNSPECIFIED
Date : 1 September 2005
Identification Number : https://doi.org/10.1002/pssa.200561905
Contributors :
ContributionNameEmailORCID
publisherWILEY-V C H VERLAG GMBH, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, DEPTH PROFILES, BOMBARDMENT, SIMULATION, DISTORTION, SOLIDS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:05
Last Modified : 17 May 2017 14:54
URI: http://epubs.surrey.ac.uk/id/eprint/829932

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