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Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Hinder, SJ, Watts, JF and Lowe, C (2004) Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy In: 10th European Conference on Applications of Surface and Interface Analysis (ECASIA 03), 2003-10-05 - 2003-10-10, Berlin, GERMANY.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Hinder, SJs.hinder@surrey.ac.ukUNSPECIFIED
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Lowe, CUNSPECIFIEDUNSPECIFIED
Date : 1 August 2004
Identification Number : https://doi.org/10.1002/sia.1830
Contributors :
ContributionNameEmailORCID
publisherJOHN WILEY & SONS LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, ultra-low-angle microtomy, x-ray photoelectron spectroscopy, polymeric coatings, depth profiling, multilayer interfaces
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:04
Last Modified : 17 May 2017 14:54
URI: http://epubs.surrey.ac.uk/id/eprint/829871

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