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Electron energy loss line spectral and TEM analysis of heterojunctions

Stolojan, V, Whiting, MJ, Goringe, MJ, Kelly, MJ and Silva, SRP (2003) Electron energy loss line spectral and TEM analysis of heterojunctions In: Conference on Microscopy of Semiconducting Materials, 2003-03-31 - ?, Univ Cambridge, Cambridge, ENGLAND.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Stolojan, VUNSPECIFIEDUNSPECIFIED
Whiting, MJm.whiting@surrey.ac.ukUNSPECIFIED
Goringe, MJUNSPECIFIEDUNSPECIFIED
Kelly, MJUNSPECIFIEDUNSPECIFIED
Silva, SRPs.silva@surrey.ac.ukUNSPECIFIED
Date : 1 January 2003
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDCullis, AGUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDMidgley, PAUNSPECIFIEDUNSPECIFIED
publisherIOP PUBLISHING LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Characterization & Testing, Microscopy, Physics, Multidisciplinary, Physics, Condensed Matter, Materials Science, Physics, TUNNEL DEVICES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:04
Last Modified : 17 May 2017 14:54
URI: http://epubs.surrey.ac.uk/id/eprint/829869

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