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Surface characterization of aspirin crystal planes by dynamic chemical force microscopy

Danesh, A, Davies, MC, Hinder, SJ, Roberts, CJ, Tendler, SJB, Williams, PM and Wilkins, MJ (2000) Surface characterization of aspirin crystal planes by dynamic chemical force microscopy ANALYTICAL CHEMISTRY, 72 (15). pp. 3419-3422.

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Item Type: Article
Authors :
NameEmailORCID
Danesh, AUNSPECIFIEDUNSPECIFIED
Davies, MCUNSPECIFIEDUNSPECIFIED
Hinder, SJs.hinder@surrey.ac.ukUNSPECIFIED
Roberts, CJUNSPECIFIEDUNSPECIFIED
Tendler, SJBUNSPECIFIEDUNSPECIFIED
Williams, PMUNSPECIFIEDUNSPECIFIED
Wilkins, MJUNSPECIFIEDUNSPECIFIED
Date : 1 August 2000
Identification Number : 10.1021/ac991498u
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Analytical, Chemistry, CHEMISTRY, ANALYTICAL, SELF-ASSEMBLED MONOLAYERS, TAPPING-MODE, ADHESION, FRICTION, GOLD, HABITS, ACID
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:00
Last Modified : 17 May 2017 14:53
URI: http://epubs.surrey.ac.uk/id/eprint/829653

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