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On the processing-structure-property relationship of ITO layers deposited on crystalline and amorphous Si

Diplas, S, Ulyashin, A, Maknys, K, Gunnaes, AE, Jorgensen, S, Wright, D, Watts, JF, Olsen, A and Finstad, TG (2007) On the processing-structure-property relationship of ITO layers deposited on crystalline and amorphous Si In: 1st International Symposium on Transparent Conducting Oxides, 2006-10-23 - 2006-10-25, Crete, GREECE.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Diplas, SUNSPECIFIEDUNSPECIFIED
Ulyashin, AUNSPECIFIEDUNSPECIFIED
Maknys, KUNSPECIFIEDUNSPECIFIED
Gunnaes, AEUNSPECIFIEDUNSPECIFIED
Jorgensen, SUNSPECIFIEDUNSPECIFIED
Wright, DUNSPECIFIEDUNSPECIFIED
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Olsen, AUNSPECIFIEDUNSPECIFIED
Finstad, TGUNSPECIFIEDUNSPECIFIED
Date : 15 October 2007
Identification Number : https://doi.org/10.1016/j.tsf.2007.03.091
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE SA, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, ITO, magnetron sputtering, AFM, XPS, TEM, IN2O3 THIN-FILMS, SOLAR-CELLS, INTERFACES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 10:58
Last Modified : 17 May 2017 14:53
URI: http://epubs.surrey.ac.uk/id/eprint/829502

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