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The determination of on-wafer noise parameters at W-band

Alam, TA, Pollard, RD and Snowden, CM (1997) The determination of on-wafer noise parameters at W-band In: 27th European Microwave Conference and Exhibition- Bridging the Gap Between Industry and Academia (EuMC 97), 1997-09-08 - 1997-09-12, JERUSALEM, ISRAEL.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Alam, TAUNSPECIFIEDUNSPECIFIED
Pollard, RDUNSPECIFIEDUNSPECIFIED
Snowden, CMc.snowden@surrey.ac.ukUNSPECIFIED
Date : 1 January 1997
Identification Number : https://doi.org/10.1109/EUMA.1997.337873
Contributors :
ContributionNameEmailORCID
publisherI E E E, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 16 May 2017 12:33
Last Modified : 16 May 2017 12:33
URI: http://epubs.surrey.ac.uk/id/eprint/814320

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