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Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system

McIntosh, PM and Snowden, CM (1997) Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system ELECTRONICS LETTERS, 33 (1). pp. 100-101.

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Item Type: Article
Authors :
NameEmailORCID
McIntosh, PMUNSPECIFIEDUNSPECIFIED
Snowden, CMc.snowden@surrey.ac.ukUNSPECIFIED
Date : 2 January 1997
Identification Number : https://doi.org/10.1049/el:19970059
Uncontrolled Keywords : Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, ENGINEERING, ELECTRICAL & ELECTRONIC, power bipolar transistors, heterojunction bipolar transistors, power transistors, heat transfer
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 16 May 2017 12:33
Last Modified : 16 May 2017 12:33
URI: http://epubs.surrey.ac.uk/id/eprint/814318

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