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Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices

Votsi, Haris, Roch-Jeune, I, Haddadi, K, Li, C, Dambrine, G, Aaen, Peter and Ridler, N (2017) Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices In: 88th ARFTG Microwave Measurement Symposium, 2016-12-06 - 2016-12-09, Austin, Texas.

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Abstract

This paper will describe the design, fabrication and testing of an on-wafer substrate that has been developed specifically for measuring extreme impedance devices using an on-wafer probe station. Such devices include Carbon Nano-Tubes (CNTs) and structures based on graphene which possess impedances in the kΩ range and are generally realised on the nano-scale rather than the micro-scale that is used for conventional on-wafer measurement. These impedances are far removed from the conventional 50 Ω reference impedance of the test equipment. The on-wafer substrate includes methods for transforming from the micro-scale to the nano-scale and reference standards to enable calibrations for extreme impedance devices. The paper includes typical results obtained from the designed wafer.

Item Type: Conference or Workshop Item (Conference Paper)
Subjects : Electronic Engineering
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute
Authors :
NameEmailORCID
Votsi, Harish.votsi@surrey.ac.ukUNSPECIFIED
Roch-Jeune, IUNSPECIFIEDUNSPECIFIED
Haddadi, KUNSPECIFIEDUNSPECIFIED
Li, CUNSPECIFIEDUNSPECIFIED
Dambrine, GUNSPECIFIEDUNSPECIFIED
Aaen, Peterp.aaen@surrey.ac.ukUNSPECIFIED
Ridler, NUNSPECIFIEDUNSPECIFIED
Date : 2 March 2017
Identification Number : 10.1109/ARFTG.2016.7839719
Copyright Disclaimer : © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDIEEE, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Calibration, on-wafer measurement, nano-scale, co-planar waveguide, RF nanotechnology, extreme impedance measurement.
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 15 Mar 2017 16:03
Last Modified : 19 Jul 2017 13:06
URI: http://epubs.surrey.ac.uk/id/eprint/813783

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