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MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter

Matjacic, L (2015) MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

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Item Type: Article
Authors :
NameEmailORCID
Matjacic, LUNSPECIFIEDUNSPECIFIED
Date : 10 November 2015
Identification Number : 10.1016/j.nimb.2015.11.020
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 15:32
Last Modified : 31 Oct 2017 18:31
URI: http://epubs.surrey.ac.uk/id/eprint/811500

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