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Nanometrology Using the Transmission Electron Microscope

Stolojan, V (2015) Nanometrology Using the Transmission Electron Microscope Morgan & Claypool Publishers. ISBN 1681741202

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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Item Type: Book
Subjects : Electronic Engineering
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering
Authors :
Stolojan, V
Date : 12 October 2015
Copyright Disclaimer : Copyright © 2015 Morgan & Claypool Publishers.
Uncontrolled Keywords : Technology & Engineering
Related URLs :
Additional Information : Full text not available from this repository.
Depositing User : Symplectic Elements
Date Deposited : 13 Jul 2016 16:29
Last Modified : 31 Oct 2017 18:26

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