Nanometrology Using the Transmission Electron Microscope

Stolojan, V (2015) Nanometrology Using the Transmission Electron Microscope Morgan & Claypool Publishers. ISBN 1681741202

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Abstract

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Item Type:	Book
Subjects :	Electronic Engineering
Divisions :	Faculty of Engineering and Physical Sciences > Electronic Engineering
Authors :	Name Email ORCID Stolojan, V
Date :	12 October 2015
Copyright Disclaimer :	Copyright © 2015 Morgan & Claypool Publishers.
Uncontrolled Keywords :	Technology & Engineering
Related URLs :	Publisher
Additional Information :	Full text not available from this repository.
Depositing User :	Symplectic Elements
Date Deposited :	13 Jul 2016 16:29
Last Modified :	31 Oct 2017 18:26
URI:	http://epubs.surrey.ac.uk/id/eprint/811207

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