Nanometrology Using the Transmission Electron Microscope
Stolojan, V (2015) Nanometrology Using the Transmission Electron Microscope Morgan & Claypool Publishers. ISBN 1681741202
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Abstract
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Item Type: | Book | ||||||
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Subjects : | Electronic Engineering | ||||||
Divisions : | Faculty of Engineering and Physical Sciences > Electronic Engineering | ||||||
Authors : |
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Date : | 12 October 2015 | ||||||
Copyright Disclaimer : | Copyright © 2015 Morgan & Claypool Publishers. | ||||||
Uncontrolled Keywords : | Technology & Engineering | ||||||
Related URLs : | |||||||
Additional Information : | Full text not available from this repository. | ||||||
Depositing User : | Symplectic Elements | ||||||
Date Deposited : | 13 Jul 2016 16:29 | ||||||
Last Modified : | 31 Oct 2017 18:26 | ||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/811207 |
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